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- ZYGO | Precision Optical Metrology | Optical Components
ZYGO is a worldwide supplier of optical metrology systems, custom optical components, and complex electro-optical systems design and manufacturing
- About Us - Zygo Corporation
Zygo is a global leader in the design and manufacture of advanced optical metrology systems and ultra-precise optical components and assemblies Our mission is to enable customer success by delivering innovative precision optical and metrology solutions that exceed expectations
- Optical Profilometer 3D Optical Profiler Products | Zygo
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds
- History - Zygo Corporation
ZYGO began as a maker of optical components of unparalleled high quality The tradition continues with these planar amplifiers for high energy lasers In 1980, ZYGO received a contract from Lawrence Livermore National Laboratory (LLNL) to fabricate plano elements for the NOVA laser project
- Laser Interferometers | Form Transmitted Wavefront | ZYGO
ZYGO laser interferometers support and enable the most demanding metrology applications in industries from semiconductor and lithography to space-borne imaging systems, cutting-edge consumer electronics, defense-related IR and thermal imaging systems and ophthalmics
- About Zygo - Zygo Corporation
Zygo Corporation is the global leader in the design and manufacture of advanced optical metrology systems and ultra-precise optical components and assemblies We've worked with global organizations for more than 50 years to make the world a better place
- Manufacturing Locations - Zygo Corporation
Zygo manufactures metrology systems across the globe Learn how to contact the closest location to you
- Coherence Scanning Interferometry | Robust Metrology | ZYGO
ZYGO's Coherence Scanning Interferometry (CSI) based 3D Optical Profilers deliver best in class performance in all of these categories These systems use the principle of optical interference to measure a sample
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