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110GHz的探针功率校准技术用于改善晶圆级S参数量测精度 . . . In this section, a novel probe-tip power calibration for S-parameters measurements, named Choon’s method, as shown in Fig 6 (a), is proposed for the first time to help achieve accurate and consistent RF source power at the probe tips
示波器测量电路高端探头 - P7700系列 TriMode探头说明书 With the TekFlex connector, the P7700 series probes offer a set of active probe tips with the probe's buffer amplifier only millimeters from the input connections
Probing Tips for High Performance Design and Measurement Tektronix oscilloscopes perform automatic probe deembedding based upon the probe’s s-parameter data Using the probe and accessory tip’s s-parameters, the scope software removes much of a probe’s loading effects to more closely resemble the signal in its "unloaded" state
RF Probe Comparison for Characterizing Passive and Active Devices These DUTs represent a wide range of measured device impedances and therefore, S-parame-ter quantities: from small to large The probe-tip calibrated reflection and transmission coeficients of the DUTs as well as the estimated measurement uncertainties are presented in Fig 3
Application - S-Parameter Probing - PacketMicro Since SS differential probe only has only two probe tips, positive and negative, one can easily make a good contact for vertical probing, double-side probing, PCB or package probing without ground pads
TDP7700 Series TriMode Probes Technical Reference - Tektronix The first time the probe tip is detected, S-parameter data for the probe tip is sent to the oscilloscope, and probe-tip specific DSP filters are generated These filters improve the measurement accuracy of high-frequency measurements
P7700 Series Datasheet - Tektronix When the probe and tip are attached to an oscilloscope, they are recognized and a unique DSP filter providing a calibrated response is enabled All calibration and filter calculation is based upon a unique set of s-parameters stored in the probe and tip
100 GHz on-wafer S-parameter measurements by electrooptic sampling Abstract: The authors describe an electrooptic sampling system with a measurement bandwidth in excess of 200 GHz for on-wafer millimeter-wave measurements An active probe frequency-multiplier has been developed to supply the millimeter-wave stimulus signal to the device under test
Probe Tip Characterization Using - TU Dresden how to determine probe S-parameter and parasitics (probe specific calibration coefficients) for different probes with only one impedance standard substrate (ISS)