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低能粒子散射谱_百度百科 低能离子散射谱（Low-Energy Ion Scattering，LEIS）是一种表面分析技术。 该技术采用能量为1,000-8,000 eV的惰性气体离子束轰击样品表层，通过弹性碰撞产生的散射离子能谱分析最表层（通常小于3个原子层）的原子成分及结构，适用于催化材料、半导体及绝缘材料表面
Low-energy ion scattering - Wikipedia LEIS involves directing a stream of charged particles known as ions at a surface and making observations of the positions, velocities, and energies of the ions that have interacted with the surface
A practical guide to interpreting low energy ion scattering (LEIS . . . It is a powerful tool for surface science Here, we present a practical guide on LEIS spectral interpretation that is based on actual LEIS spectra of a variety of materials While this article covers some of the theory of LEIS, it is not an exhaustive description of this aspect of the technique
Low energy ion scattering (LEIS). A practical introduction to its . . . In this article, we provide a practical introduction to the technique, including a discussion of the basic theory of LEIS, LEIS spectra, LEIS instrumentation, and LEIS applications, including catalysts, solid oxide fuel cells (SOFCs), and thin films in integrated circuits
Low Energy Ion Scattering (LEIS) Spectroscopy | SpringerLink This overview chapter introduces the LEIS technique and highlights the significant advantages offered by the newer HS-LEIS spectroscopy Examples will be selected from one component bulk oxides, bulk mixed oxides, supported metal oxides, supported metals, and supported bimetallic catalytic materials